矿物表面性能测试技术研究进展

    The development of analytical techniques on mineral surface

    • 摘要: 本文介绍了在矿物颗粒测试中常用的几种表面表征技术的工作原理及应用:扫描电子显微镜(SEM),QEMSCAN,红外光谱(FT-IR),拉曼光谱(Raman),二次离子质谱仪(ToF-SIMS)和X射线光电子能谱(XPS)等。在阐述每种技术的工作原理后,举例说明了这些技术在矿物颗粒表面测试方面的最新进展,以湿法冶金浸出过程中的黄铜矿表面测试为例对部分表征方法进行了详细介绍。除重点介绍矿物颗粒表面微观形貌以及化学组成的测试技术外,还提及了同步辐射技术在这方面的应用。事实证明,不同技术都有其优缺点,因此,在研究过程中要根据不同矿物颗粒表面性质的差异来选择合适的分析方法以达到表征目的。

       

      Abstract: This paper introduces the principles and applications of some common surface analysis techniques for minerals,e.g.SEM,QEMSCAN,FT-IR, Raman,ToF-SIMS and XPS.After illustrating the principles of each technique,some examples have been presented to show the most recent development of these techniques.Specifically,the application of some techniques in hydrometallurgical processing of chalcopyrite have been explained in details.In addition to these techniques used for analysing the surface microtopography and chemical compositions,the applications of synchrotron-based techniques have also been mentioned.It should be noted that both advantages and disadvantages are present for all these techniques.Therefore,suitable analysis techniques should be selected depending on the different surface properties of various minerals.

       

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